).svg)
Conventional physical metrology is highly dependent on hardware.
In manufacturing, it is critical to conduct quality checks through metrology or measurement of key variables of a process outcome, such as feature size, alignment, and weight. This is usually done through metrology equipment and sensors that are expensive investments that take up valuable space on the fab floor and are expensive to maintain.
%201.svg)
Cost
Capex & opex for HW equipment & sensors
%201.svg)
Space & Time
Footprints in fabs & delays in queues
%201.svg)
Env. Footprint
Energy and carbon for metrology & inspection
Low Sampling
Intermittent snapshots of known variables
And even so, the machines cannot capture all possible measurements, which means low sampling rates. They alone cannot give a full picture of how goods are manufactured.
We solve the challenges of physical metrology with AI software, without adding hardware.
Meet Panoptes. Named after the 100-eyed giant in Greek mythology, Panoptes provides extensive monitoring and metrology capabilities without adding new hardware by harnessing our state-of-the-art AI technology and a vast amount of manufacturing data. It empowers manufacturers to see everything in real-time. Panoptes consists of Panoptes VM (virtual metrology) and Panoptes IM (image metrology). These solutions have been proven in major high-volume manufacturing semiconductor fabs. Panoptes opens up a new, exciting era of software-defined (and AI-powered) metrology!
)-svg.svg)
)-svg.svg)
)-svg.svg)
