Panoptes Image Metrology (IM)
Shatters the limit of conventional image metrology solutions
Panoptes IM is an integrated image metrology solution that overcomes the physical and software limits of conventional measurement tools through state-of-the-art computer vision technology.
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Shatters the limit of conventional image metrology solutions
Panoptes IM is an integrated image metrology solution that overcomes the physical and software limits of conventional measurement tools through state-of-the-art computer vision technology.
Shatters the limit of conventional image metrology solutions
Panoptes IM is an integrated image metrology solution that overcomes the physical and software limits of conventional measurement tools through state-of-the-art computer vision technology.
Features
To overcome the limit on metrology resources, Panoptes IM enhances higher-throughput, lower-quality images by advanced denoising techniques. This enables faster acquisition without any loss in the image quality. In addition to automatically measuring all conventional measurands in a given image, Panoptes IM also detects anomalies within the image and identifies their causes, which serves as another indicator for yield changes. In order to handle diverse metrology recipes, Panoptes IM provides a unified set of recipes, or methods and procedures for measuring features in images. These recipes are created, tested, deployed, and managed in an engineering platform, which is integrated seamlessly with existing manufacturing systems.
Image Enhancement
reduces the image acquisition time without accuracy loss
reduces the image acquisition time without accuracy loss
Anomaly Detection
alerts for outliers and
identifies possible causes
alerts for outliers and
identifies possible causes
Automatic Metrology
adapts common recipes quickly to new products, processes, and measurands
adapts common recipes quickly to new products, processes, and measurands
Integrated Engineering Platform
creates, tests, deploys, and
manages diverse recipes
creates, tests, deploys, and
manages diverse recipes
Features
To overcome the limit on metrology resources, Panoptes IM enhances higher-throughput, lower-quality images by advanced denoising techniques. This enables faster acquisition without any loss in the image quality. In addition to automatically measuring all conventional measurands in a given image, Panoptes IM also detects anomalies within the image and identifies their causes, which serves as another indicator for yield changes. In order to handle diverse metrology recipes, Panoptes IM provides a unified set of recipes, or methods and procedures for measuring features in images. These recipes are created, tested, deployed, and managed in an engineering platform, which is integrated seamlessly with existing manufacturing systems.
Image Enhancement
reduces the image acquisition time without accuracy loss
reduces the image acquisition time without accuracy loss
Anomaly Detection
alerts for outliers and
identifies possible causes
alerts for outliers and
identifies possible causes
Automatic Metrology
adapts common recipes quickly to new products, processes, and measurands
adapts common recipes quickly to new products, processes, and measurands
Integrated Engineering Platform
creates, tests, deploys, and
manages diverse recipes
creates, tests, deploys, and
manages diverse recipes